ALS Beamlines and Contacts
Indvidual Beamline Parameters and Beamline Scientist Contact Information
Clickable ALS Beamline Diagram
Beamline data is available through the links below. Unless otherwise noted, all beamlines are currently operational.
| Beamline | Source* | Areas of Research/Techniques (linked to beamline Web site, where available) |
Energy Range | Beamline Scientist(s) |
|---|---|---|---|---|
| 1.4.3 | Bend | Infrared spectromicroscopy | 0.05-1.2 eV | M. Martin (510) 495-2231 |
| 1.4.4 | Bend | Infrared spectromicroscopy | 0.05-1.5 eV | |
| 2.1 | Bend | National Center for X-Ray Tomography (NCXT) |
200 eV-7 keV |
M. Le Gros
(510) 486-6892 |
| 3.1 | Bend | Diagnostic beamline | 1-2 keV |
F. Sannibale
(510) 486-5924 |
| 3.2.1 | Bend | Commercial deep-etch x-ray lithography (LIGA) | 3-12 keV | G. Reiff (510) 495-2032 |
| 4.0.2 | EPU5 | Magnetic and biochemical spectroscopy | 80-1900 eV | E. Arenholz
(510) 495-2041 |
| 4.0.3 | EPU9 | High-resolution spectroscopy of complex materials (MERLIN) Operational: 2010 |
10-150 eV | Yi-De Chuang (510) 495-2049 |
| 4.2.2 | Superbend | Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography | 5-17 keV | Jay Nix Ed Westbrook Michael McCormick (510) 486-6652 |
| 5.0.1 | W11 | Monochromatic macromolecular crystallography and Se Single Wavelength Anomalous Diffraction (Se-SAD) | 12.4 keV |
S. Morton P. Zwart (510) 495-2051 (510) 495-2052 (510) 495-2054 |
| 5.0.2 | W11 | Multiple-wavelength anomalous diffraction (MAD) and monochromatic macromolecular crystallography | 4-16 keV | |
| 5.0.3 | W11 | Monochromatic macromolecular crystallography | 12.4 keV | |
| 5.3.1 | Bend | Instrumentation development | 1.8-12 keV | R. Celestre (510) 495-2053 |
| 5.3.2 | Bend | Polymer scanning transmission x-ray microscopy | 200-650 eV | D. Kilcoyne (510) 495-2057 |
| 6.0.1 | U3 | Femtosecond phenomena Operational: 2009 |
2-10 keV |
P. Heimann (510) 495-2087 |
| 6.0.2 | U3 | Femtosecond phenomena | 200-1800 eV | |
| 6.1.2 | Bend | High-resolution zone-plate microscopy | 300-1300 eV | P. Fischer (510) 495-2061 |
| 6.3.1 | Bend | Magnetic spectroscopy and materials science | 300-2000 eV | E. Arenholz 510 495-2062 |
| 6.3.2 | Bend | Calibration and standards; EUV optics testing; atomic, molecular, and materials science | 50-1300 eV | E. Gullikson (510) 495-2063 |
| 7.0.1 | U5 | Surface and materials science, spectromicroscopy | 60-1200 eV | J. Guo (510) 495-2070 (510) 495-2079 E. Rotenberg (510) 495-2071 Aaron Bostwick (510) 486-4816 |
| 7.2 | Bend | Diagnostic beamline | Far IR- 17 keV | F. Sannibale
(510) 486-5924 |
| 7.3.1 | Bend | Magnetic microscopy, spectromicroscopy Note: This program has moved to Beamline 11.0.1 |
175-1500 eV | A. Scholl (510) 495-2073 |
| 7.3.3 | Bend | Small- and wide-angle x-ray scattering (SAXS/WAXS) | 10 keV | A. Hexemer (510) 495-2075 (510) 495-2076 |
| 8.0.1 | U5 | Surface and materials science, imaging photoelectron spectroscopy, soft x-ray fluorescence | 65-1400 eV | W. Yang J. Denlinger (510) 495-2080 (510) 495-2089 |
| 8.2.1 | Superbend | Multiple-wavelength anomalous diffraction (MAD) and monochromatic macromolecular crystallography | 5-17 keV | C. Ralston S. Morton (510) 495-2081 (510) 495-2082 |
| 8.2.2 | Superbend | Multiple-wavelength anomalous diffraction (MAD) and monochromatic macromolecular crystallography | 5-17 keV | |
| 8.3.1 | Superbend | Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography | 2.4-18 keV | J. Holton (510) 495-2083 |
| 8.3.2 | Superbend | Tomography | 5-60 keV | A. MacDowell (510) 495-2005 |
| 9.0.1 | U10 | Coherent optics experiments | 200-800 eV | S. Marchesini D. Shapiro (510) 495-2091 |
| 9.0.2 | U10 | Chemical dynamics | 7.5-25 eV | M. Ahmed K. Wilson (510) 495-2092 |
| 9.3.1 | Bend | Atomic, molecular, and materials science Note: This beamline is NOT open to general users. |
2.2-5.5 keV |
Z. Hussain (510) 486-7591 (ALS contact) |
| 9.3.2 | Bend | Chemical and materials science, circular dichroism, spin resolution | 30-1400 eV | Z. Liu (510) 495-2109 |
| 10.0.1 | U10 | Photoemission of highly correlated materials; high-resolution atomic, molecular, and optical physics | 17-340 eV | (HERS) Z. Hussain (510) 486-7591 (AMO) A. Aguilar (510) 495-2102 |
| 10.3.1 | Bend | X-ray fluorescence microprobe | 3-20 keV | S. Cliff
(510) 495-2103 |
| 10.3.2 | Bend | Environmental and materials science, micro x-ray absorption spectroscopy | 2.5-17 keV | M. Marcus (510) 495-2106 |
| 11.0.1 | EPU 5 | Magnetic microscopy, spectromicroscopy (PEEM3) |
100-2000 eV |
A. Scholl (510) 495-2010 |
| 11.0.2 | EPU5 | Molecular environmental science | 95-2000 eV | D. Shuh T. Tyliszczak (510) 495-2077 |
| 11.3.1 | Bend | Small-molecule crystallography | 6-17 keV | S. Teat (510) 495-2117 |
| 11.3.2 | Bend | Inspection of EUV lithography masks | 50-1000 eV |
K. Goldberg
(510) 495-2077 Iacopo Mochi |
| 12.0.1 | U8 | EUV optics testing and interferometry, angle- and spin-resolved photoemission | 24-350 eV | (ARPES) A. Fedorov (510) 495-2121 (EUV/ MET) K. Goldberg P. Naulleau (510) 495-2120 (510) 495-2107 |
| 12.0.2 | U8 | Coherent soft x-ray science | 2001000 eV | S. Roy
(510) 495-2107 |
| 12.2.2 | Superbend | California High-Pressure Science Observatory (CALIPSO) | 6-40 keV | S. Clark (510) 495-2055 |
| 12.3.1 | Superbend | Structurally Integrated Biology for Life Sciences (SIBYLS) | 5.5-17 keV |
G. Hura
M. Hammel S. Classen (510) 495-2134 |
| 12.3.2 | Superbend | X-ray microdiffraction |
6-22 keV |
N. Tamura
(510) 486-4625 Martin Kunz (510) 486-6789 |
| BTF | Linac | Beam Test Facility | 50-MeV electrons | B. Ludewight (510) 495-2021 W. Byrne (510) 495-2009 |
* Bend bend magnet Superbend Superconducting bend magnet EPUx x-cm-period elliptical polarization undulator Ux x-cm-period undulator Wx x-cm-period wigglerTechnical Specifications