| Abstract Title | Author | Beamline | Year |
| Micro-characterization of KDP etch pits | A. Nelson, T. van Buuren, P.K. Whitman, J.J. De Yoreo, P.A. Baisden, L.J. Terminello, G.D. Ackerman, Z. Hussain | 7.3.1.2 | 1999 |
| X-ray absorption and soft x-ray fluorescence analysis of KDP crystals | A. Nelson, T. van Buuren, C. Bostedt, N. Franco, P.K. Whitman, J.J. De Yoreo, P.A. Baisden, L.J. Terminello, T.A. Callcott | 8.0.1 | 1999 |