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Beamline 7.3.3

X-Ray Microdiffraction

Operational

Now

Source characteristics

Bend magnet

Energy range

6–12 keV

Monochromator

White light and monochromatic [two- and four-crystal Ge(111)]

Calculated flux (1.9 GeV, 400 mA)

At typically 8.5 keV:
1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot)
1 x 1012 photons/s/3x10-4BW (100 x 300 µm spot)

Resolving power (E/DE)

1000–7000 depending on vertical convergence accepted

Detectors

X-ray CCD, image plate, fluorescence Si(Li) detector

Spot size at sample

100 x 300 µm down to 1 x 1 µm

Samples

Format

Typically less than 1 cm2 x 1 mm thick

Sample environment

Typically air

Special notes

Microprobe, white-light, and monochromatic experiments

Scientific applications

Measurement of thin film strain, environmental science

Local contacts/spokespersons

Name: Nobumichi Tamura (x-ray microdiffraction)
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-6189
Fax: (510) 486-7696
Email: ntamura@lbl.gov

Name: A.A. MacDowell (hard x-ray technique development)
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-4276
Fax: (510) 486-7696
Email: aamacdowell@lbl.gov

Beamline phone numbers

(510) 495-2075, (510) 495-2076

Table of all beamlines