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Beamline 9.3.2

Chemical and Materials Science,
Circular Dichroism, Spin Resolution

Operational

Now

Source characteristics

Bend magnet

Energy range

30–1400 eV

Monochromator

SGM (gratings: 100, 600, 1200 lines/mm)

Calculated flux (1.9 GeV, 400 mA)

~1011 photons/s/0.1%BW at 400 eV

Resolving power (E/DE)

3000 typical, 8000 max (with 10-µm slits)

Spatial resolution

0.5 x 1 mm

Endstations

Advanced Materials Chamber (AMC)
Ambient Pressure Photoemission

Beamline phone numbers

(510) 495-2093, (510) 495-2109

Advanced Materials Chamber (AMC)

Characteristics

Studies of atomic and electronic structure of surfaces; capability for circularly polarized radiation

Detectors

Scienta SES 100 electron energy analyzer

Spot size at sample

0.5 x 1 mm

Samples

Format

UHV-compatible solids up to 10 mm in diameter

Preparation

Sputtering, evaporation, quartz-crystal oscillator, LEED XPS

Sample environment

UHV, large-gap in-situ magnet, heating up to 2300 K, cooling to 200 K, precision manipulator

Special notes

Sample transfer capability

Experimental techniques

Photoelectron diffraction, XPS, NEXAFS, MCD

Local contact/spokesperson

Name: Nasser Hamdan
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-7633
Email: NMHamdan@lbl.gov

Ambient Pressure Photoemision

Characteristics

Photoemission spectroscopy at pressures up to 10 Torr

Detectors

PHI analyzer, 16-element multichannel detector with differentially pumped electron-transfer-lens system

Spot size at sample

0.5 x 1 mm

Samples

Format

Vacuum-compatible solids up to 10 mm in diameter

Preparation

Sputtering

Sample environment

Gas pressure up to 10 Torr

Experimental techniques

Photoemission spectroscopy at ambient pressure of processes such as catalysis and corrosion, and of environmental and biological systems

Local contact/spokesperson

Name: Nasser Hamdan
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-7633
Email: NMHamdan@lbl.gov

Table of all beamlines