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Beamline 9.3.2
Chemical and Materials Science,
Circular Dichroism, Spin Resolution
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Operational
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Now
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Source characteristics
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Bend magnet
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Energy range
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30–1400 eV
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Monochromator
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SGM (gratings: 100, 600, 1200 lines/mm)
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Calculated flux (1.9 GeV, 400 mA)
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~1011 photons/s/0.1%BW at 400 eV
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Resolving power (E/DE)
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3000 typical, 8000 max (with 10-µm slits)
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Spatial resolution
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0.5 x 1 mm
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Endstations
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Advanced Materials Chamber (AMC)
Ambient Pressure Photoemission
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Beamline phone numbers
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(510) 495-2093, (510) 495-2109
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Advanced Materials Chamber (AMC)
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Characteristics
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Studies of atomic and electronic structure of surfaces; capability for circularly polarized radiation
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Detectors
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Scienta SES 100 electron energy analyzer
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Spot size at sample
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0.5 x 1 mm
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Samples
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Format
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UHV-compatible solids up to 10 mm in diameter
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Preparation
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Sputtering, evaporation, quartz-crystal oscillator, LEED XPS
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Sample environment
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UHV, large-gap in-situ magnet, heating up to 2300 K, cooling to 200 K, precision manipulator
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Special notes
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Sample transfer capability
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Experimental techniques
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Photoelectron diffraction, XPS, NEXAFS, MCD
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Local contact/spokesperson
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Name: Nasser Hamdan
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-7633
Email: NMHamdan@lbl.gov
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Ambient Pressure Photoemision
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Characteristics
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Photoemission spectroscopy at pressures up to 10 Torr
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Detectors
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PHI analyzer, 16-element multichannel detector with differentially pumped electron-transfer-lens system
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Spot size at sample
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0.5 x 1 mm
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Samples
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Format
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Vacuum-compatible solids up to 10 mm in diameter
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Preparation
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Sputtering
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Sample environment
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Gas pressure up to 10 Torr
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Experimental techniques
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Photoemission spectroscopy at ambient pressure of processes such as catalysis and corrosion, and of environmental and biological systems
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Local contact/spokesperson
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Name: Nasser Hamdan
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-7633
Email: NMHamdan@lbl.gov
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Table of all beamlines
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