Operational

Now

Source characteristics

Bend magnet

Energy range

0.006 - 3 eV

Frequency range

50 cm^-1 to 25,000 cm^-1

Interferometer resolution

0.125 cm^-1

Endstations

Bruker IFS66v/S FTIR (vacuum), Surface Science UHV Chamber

Characteristics

Rapid- and Step-Scan FTIR, up to 5 nsec time resolution, transmission and reflection modes

Spatial resolution

Diffraction limited (~wavelength)

Detectors

Silicon Bolometer (LHe cooled)
Wide-range MCT (mercury cadmium telluride)
Gap Diode
Silicon Diode
Fast Silicon Diode
DTGS Mid-IR
DTGS Far-IR

Spot size at sample

1 mm (varies with coupling optics)

Samples

Preparation

Stereo microscope and table available
UHV surface science chamber

Sample environment

10^-2 Torr vacuum in main FTIR bench or 10^-9 Torr vacuum in surface science chamber

Scientific applications

Sub-monolayers on surfaces, polymers, semiconductors, superconductors, environmental samples, forensic studies, etc.

Local contact

Name: Michael C. Martin
Phone: (510) 495-2231
Fax: (510) 486-7696
Email: mcmartin@lbl.gov

Spokesperson

Name: Wayne R. McKinney
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-4395
Fax: (510) 486-7696
Email: wrmckinney@lbl.gov