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Beamline 1.4.3

Infrared Spectromicroscopy

Operational

Now

Source characteristics

Bend magnet

Energy range

0.05 - 1 eV

Frequency range

450 cm-1 to 10,000 cm-1

Interferometer resolution

0.125 cm-1

Endstations

Nicolet 760 FTIR, Nic-Plan IR microscope (N2 purged)

Characteristics

Motorized sample stage, micron resolution, transmission and reflection modes

Spatial resolution

Diffraction limited (~ wavelength)

Detectors

Extended-range MCT (mercury cadmium telluride)

Spot size at sample

10 µm (diffraction limited)

Samples

Preparation

Stereo microscope and table available

Sample environment

N2 purged, minimal clean area (no particle specification)

Scientific applications

Particulate contamination, biological samples, forensic studies, laminates, polymers, fibers, environmental samples

Local contact

Name: Michael C. Martin
Phone: (510) 495-2231
Fax: (510) 486-7696
Email: mcmartin@lbl.gov

Spokesperson

Name: Wayne R. McKinney
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-4395
Fax: (510) 486-7696
Email: wrmckinney@lbl.gov

Table of all beamlines