Beamline 6.1.2
High-Resolution Zone-Plate Microscopy
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Operational |
Now |
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Source characteristics |
Bend magnet |
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Energy range |
500 - 800 eV (extended range 250 - 950 eV) |
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Monochromator |
Zone plate linear |
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Calculated flux (1.9 GeV, 400 mA) |
Images with 1000 x 1000 pixels, 1000 photons/pixel are recorded in 3 sec at 517 eV/0.3%BW |
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Resolving power (E/DE) |
200 - 500 (with 20 - 5 µm field of view) |
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Endstation |
X-ray microscope (XM-1) |
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Characteristics |
Conventional-type (full-field) soft x-ray microscope |
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Spatial resolution |
40 nm |
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Detectors |
Back-thinned CCD camera |
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Field of view |
5 to 20 µm single field; larger areas can be tiled together like a mosaic |
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Samples |
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Format |
Thin samples (up to 10 µm thick) on silicon nitride or other foils, wet chamber provided |
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Preparation |
Sample dependent |
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Sample environment |
Helium at atmospheric pressure, wet or dry, low temperature (cryo) (in preparation) |
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Special notes |
Mutual indexing system with visible-light microscopy provided to position and focus sample |
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Scientific applications |
Biology, environmental sciences, material sciences, polymers |
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Local contact/spokesperson |
Name: Werner Meyer-Ilse |
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