navigation bypass navigation contact us ring status schedules user guide links notices user sites people and policies jobs MicroWorlds publications meetings microscopes specifications About the ALS science highlights ALSNews home
 

 

 

Beamline 7.3.1.1

Magnetic Microscopy, Spectromicroscopy

Operational

Now

Source characteristics

Bend magnet

Energy range

260 - 1500 eV

Monochromator

SGM

Calculated flux (1.9 GeV, 400 mA)
(linearly polarized)

3 x 1012 photons/sec/0.1%BW at 800 eV

Resolving power (E/DE)

1800 at 800 eV

Endstation

Photoemission electron microscope (PEEM2)

Characteristics

Imaging of electron emission

Spatial resolution

200 x 200 Å (designed)

Detectors

Slow scan CCD

Spot size at sample

Less than or equal to 50 x 50 µm

Samples

Conductive solids up to 1 cm2 in area

Format

Solid

Preparation

Sputtering, heating, evaporation transfer capability

Sample environment

UHV

Special notes

Choice of linearly or circularly polarized radiation (flux of circularly polarized radiation is reduced)

Scientific applications

Real-time study of magnetic, elemental, chemical, and topological properties of materials

Local contact

Name: Simone Anders
Phone: (510) 486-5928
Fax: (510) 486-7696
Email: sanders@lbl.gov

Spokesperson

Name: Joachim Stöhr
Affiliation: IBM Almaden Research Center
Phone: (408) 927-2461
Fax: (408) 927-2100
Email: stohr@almaden.ibm.com

Table of all beamlines