Operational

Now

Source characteristics

5-cm-period undulator (U5)
(first, third, and fifth harmonics)

Energy range

95 - 1200 eV (1.5 GeV); 210 - 1200 eV (1.9 GeV)

Monochromator

SGM (gratings: 150, 380, 925 l/mm)

Flux (1.9 GeV, 400 mA)

10¹⁰ - 10¹⁴ photons/sec
(resolution and energy dependent)

Resolving power (E/DE)

3000 typical, 8000 optimized

Endstations

Ellipsoidal-mirror electron energy analyzer
Soft x-ray fluorescence spectrometer

Endstation identifier

Ellipsoidal-mirror electron energy analyzer (EMA)

Characteristics

Measures 84° of electron emission angles from solid samples with 80 meV resolution

Spot size at sample

100 µm

Samples

Solids

Format

Less than 1 x 1 cm

Preparation

In-situ resistive heating; in-situ evaporation

Sample environment

UHV

Special notes

Sample transfer capabilities; preparation chamber

Scientific applications

XPS, ARPES, NEXAFS of solids and surfaces

Local contact

Name: Clemens Heske
Phone: (510) 486-7249
Fax: (510) 486-4299
Email: ctheske@lbl.gov

Spokesperson

Name: Franz Himpsel
Affiliation: University of Wisconsin, Madison
Phone: (608) 263-5590
Fax: (608) 263-2334
Email: himpsel@comb.physics.wisc.edu

Endstation identifier

Soft x-ray fluorescence spectrometer

Characteristics

Measures the soft x-ray emission from solid samples
with a dispersive grating spectrometer

Spot size at sample

100 µm

Samples

Solids

Format

Samples up to 4" (10.1 cm) in diameter

Sample environment

UHV

Special notes

Sample transfer capabilities

Scientific applications

SXF, fluorescence-yield XAS of solids

Local contact

Name: Melissa Grush
Phone: (510) 486-6645
Fax: (510) 486-4773
Email: mmgrush@lbl.gov

Spokesperson

Name: Thomas Callcott
Affiliation: University of Tennessee
Phone: (423) 974-6765
Fax: (423) 974-3949
Email: tomc@utkux.utcc.utk.edu