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Beamline 9.3.1

Atomic, Molecular, and Materials Science

Operational	Now
Source characteristics	Bend magnet
Energy range	2200 - 6000 eV with Si(111) crystals
Monochromator	Double crystal
Measured flux (1.9 GeV, 300 mA)	Greater than 10¹¹ photons/sec/2200 - 5000 eV
Resolving power (E/DE)	3000 - 8000
Endstations	X-ray absorption cell Ion time-of-flight spectrometer Angle-resolved time-of-flight electron spectrometer Angle-resolved hemispherical electron analyzer Polarized-x-ray emission spectrometer

Endstation identifier	X-ray absorption cell
Detectors	Photodiode
Spot size at sample	Less than 0.5 mm
Samples	Powder, 1/2" diameter; gases
Sample environment	UHV, gas cell
Scientific applications	NEXAFS
Local contact	Name: Rupert Perera Phone: (510) 486-5680 Fax: (510) 486-4550 Email: rupert@lbl.gov
Spokesperson	Name: Dennis Lindle Affiliation: University of Nevada, Las Vegas Phone: (702) 895-4426 Fax: (702) 895-4072 Email: lindle@nevada.edu

Endstation identifier	Ion time-of-flight spectrometer
Characteristics	Timing resolution ~200 ps; capable of coincidence measurement (ion-ion, ion-ion-ion, electron-ion, electron-ion-ion, etc.)
Detectors	Microchannel plates for ions, channeltron for electrons
Spot size at sample	Less than 0.5 mm
Samples	Gases
Sample environment	Gas-phase flow system
Scientific applications	Ion spectroscopy, total and partial ion yields, PIPICO, PEPICO, PEPIPICO, etc.
Local contact	Name: Wayne Stolte Phone: (510) 486-5538 Fax: (510) 495-2111 Email: wstolte@unlinfo.unl.edu
Spokesperson	Name: Dennis Lindle Affiliation: University of Nevada, Las Vegas Phone: (702) 895-4426 Fax: (702) 895-4072 Email: lindle@nevada.edu

Endstation identifier	Angle-resolved time-of-flight electron spectrometer
Characteristics	Timing resolution ~200 ps; chamber rotates about x-ray beam (±100°)
Detectors	Four time-of-flight electron analyzers (0.5 m long)
Spot size at sample	Less than 0.5 mm
Samples	Gases
Sample environment	Gas-phase flow system
Scientific applications	Photoelectron and Auger spectroscopy, electron-electron coincidence
Local contact	Name: Honghong Wang Phone: (510) 486-5804 Fax: (510) 495-2111 Email: wangh@nevada.edu
Spokesperson	Name: Dennis Lindle Affiliation: University of Nevada, Las Vegas Phone: (702) 895-4426 Fax: (702) 895-4072 Email: lindle@nevada.edu

Endstation identifier	Angle-resolved hemispherical electron analyzer
Characteristics	High energy resolution (E/DE less than or equal to 5000) and high electron kinetic energies (less than or equal to 5 keV); chamber rotates about x-ray beam and analyzer rotates about a perpendicular axis, allowing coverage of ~1p steradians
Detectors	2-D position-sensitive detector (microchannel plates plus resistive anode)
Spot size at sample	Less than 0.5 mm
Samples	Gases
Sample environment	Gas-phase flow system
Scientific applications	Photoelectron and Auger spectroscopy
Local contact	Name: Honghong Wang Phone: (510) 486-5804 Fax: (510) 495-2111 Email: wangh@nevada.edu
Spokesperson	Name: Dennis Lindle Affiliation: University of Nevada, Las Vegas Phone: (702) 895-4426 Fax: (702) 895-4072 Email: lindle@nevada.edu

Endstation identifier	Polarized-x-ray emission spectrometer (available in 1998)
Characteristics	High x-ray energy resolution (E/DE ~ 3000). Curved-crystal Rowland-circle spectrometer
Detectors	2-D position-sensitive detector (microchannel plates plus resistive anode)
Spot size at sample	Less than 0.5 mm
Samples	Gases
Sample environment	Static gas cell with windows
Scientific applications	X-ray emission
Local contact	Name: Wayne Stolte Phone: (510) 486-5538 Fax: (510) 495-2111 Email: wstolte@unlinfo.unl.edu
Spokesperson	Name: Dennis Lindle Affiliation: University of Nevada, Las Vegas Phone: (702) 895-4426 Fax: (702) 895-4072 Email: lindle@nevada.edu

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