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Beamline 9.3.2
Chemical and Materials Science, Circular Dichroism, Spin Resolution
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Operational
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Now
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Source characteristics
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Bend magnet
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Energy range
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30 - 1500 eV
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Monochromator
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SGM (gratings: 100, 600, 1200 l/mm)
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Calculated flux (1.9 GeV, 400 mA)
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~1011 photons/sec/0.1%BW at 400 eV
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Resolving power (E/DE)
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3000 typical, 8000 max (with 10-µm slits)
Capability for circularly polarized radiation
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Endstations
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Advanced materials chamber (AMC)
Advanced photoelectron spectrometer/diffractometer (APSD)
Users may bring their own endstation
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Endstation identifier
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Advanced materials chamber (AMC)
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Characteristics
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PHI analyzer, sample preparation with LEED, XPS, evaporation, sputtering, precision manipulator
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Spatial resolution
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0.5 x 1 mm2
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Detectors
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16-element multichannel detector, partial electron yield detector
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Spot size at sample
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0.5 x 1 mm2
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Samples
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Solid
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Format
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5 - 10 mm diameter
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Preparation
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Sputtering, evaporation, XPS, LEED,
heating up to 2000°C; cooling down to 80°K
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Sample environment
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UHV
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Special notes
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Sample transfer capability
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Experimental techniques
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Photoelectron diffraction, XPS, NEXAFS, MCD
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Scientific applications
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Studies of atomic and electronic structure of surfaces
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Local contact
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Name: Zhou Xin
Phone: (510) 486-7633
Fax: (510) 486-4299
Email: xin@ux8.lbl.gov
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Spokesperson
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Name: Eddie Moler
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-7637
Fax: (510) 486-4299
Email: ejmoler@lbl.gov
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Endstation identifier
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Advanced photoelectron spectrometer/diffractometer (APSD)
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Characteristics
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High-resolution rotatable Scienta analyzer, sample preparation with LEED, evaporator, high-precision sample manipulator, sputtering
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Spatial resolution
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5 µm with pre-lens
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Detectors
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Multichannel detector and spin-resolved mini Mott
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Spot size at sample
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0.5 x 1.0 mm
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Samples
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Solid
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Format
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5 - 10 mm diameter, 1 - 2 mm thick
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Preparation
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Sputtering, evaporation, LEED, XPS,
heating up to 2000°C; cooling down to 150°K
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Sample environment
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UHV
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Special notes
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Capability of using either a multichannel detector or a spin detector, analyzer rotatable in horizontal plane
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Experimental techniques
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Photoelectron diffraction, high-resolution XPS, UPS, MCD
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Scientific applications
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Studies of the atomic, electronic, and magnetic structure of surfaces, interfaces, and nanostructures
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Local contact
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Name: Zahid Hussain
Phone: (510) 486-7591
Fax: (510) 486-7696
Email: hussain@lbl.gov
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Spokesperson
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Name: Professor C. S. Fadley
Affiliation: Material Sciences Division, Berkeley Lab;
and U. California, Davis
Phone: (510) 486-5774; (916) 752-8788
Fax: (510) 486-4680
Email: fadley@lbl.gov
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Table of all beamlines
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