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Beamline 9.3.2

Chemical and Materials Science, Circular Dichroism, Spin Resolution

Operational

Now

Source characteristics

Bend magnet

Energy range

30 - 1500 eV

Monochromator

SGM (gratings: 100, 600, 1200 l/mm)

Calculated flux (1.9 GeV, 400 mA)

~1011 photons/sec/0.1%BW at 400 eV

Resolving power (E/DE)

3000 typical, 8000 max (with 10-µm slits)
Capability for circularly polarized radiation

Endstations

Advanced materials chamber (AMC)
Advanced photoelectron spectrometer/diffractometer (APSD)
Users may bring their own endstation

 

Endstation identifier

Advanced materials chamber (AMC)

Characteristics

PHI analyzer, sample preparation with LEED, XPS, evaporation, sputtering, precision manipulator

Spatial resolution

0.5 x 1 mm2

Detectors

16-element multichannel detector, partial electron yield detector

Spot size at sample

0.5 x 1 mm2

Samples

Solid

Format

5 - 10 mm diameter

Preparation

Sputtering, evaporation, XPS, LEED,
heating up to 2000°C; cooling down to 80°K

Sample environment

UHV

Special notes

Sample transfer capability

Experimental techniques

Photoelectron diffraction, XPS, NEXAFS, MCD

Scientific applications

Studies of atomic and electronic structure of surfaces

Local contact

Name: Zhou Xin
Phone: (510) 486-7633
Fax: (510) 486-4299
Email: xin@ux8.lbl.gov

Spokesperson

Name: Eddie Moler
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-7637
Fax: (510) 486-4299
Email: ejmoler@lbl.gov

 

Endstation identifier

Advanced photoelectron spectrometer/diffractometer (APSD)

Characteristics

High-resolution rotatable Scienta analyzer, sample preparation with LEED, evaporator, high-precision sample manipulator, sputtering

Spatial resolution

5 µm with pre-lens

Detectors

Multichannel detector and spin-resolved mini Mott

Spot size at sample

0.5 x 1.0 mm

Samples

Solid

Format

5 - 10 mm diameter, 1 - 2 mm thick

Preparation

Sputtering, evaporation, LEED, XPS,
heating up to 2000°C; cooling down to 150°K

Sample environment

UHV

Special notes

Capability of using either a multichannel detector or a spin detector, analyzer rotatable in horizontal plane

Experimental techniques

Photoelectron diffraction, high-resolution XPS, UPS, MCD

Scientific applications

Studies of the atomic, electronic, and magnetic structure of surfaces, interfaces, and nanostructures

Local contact

Name: Zahid Hussain
Phone: (510) 486-7591
Fax: (510) 486-7696
Email: hussain@lbl.gov

Spokesperson

Name: Professor C. S. Fadley
Affiliation: Material Sciences Division, Berkeley Lab;
and U. California, Davis
Phone: (510) 486-5774; (916) 752-8788
Fax: (510) 486-4680
Email: fadley@lbl.gov

Table of all beamlines