navigation bypass navigation contact us ring status schedules user guide links notices user sites people and policies jobs MicroWorlds publications meetings microscopes specifications About the ALS science highlights ALSNews home
 

 

 

Beamline 10.0.1

High-Resolution Atomic, Molecular, and Optical Physics;
Photoemission of Highly Correlated Materials

(Beamline 9.0.1 was moved to Sector 10 in 1998 and with some modifications became Beamline 10.0.1.)

Operational

Now

Source characteristics

10-cm-period undulator (U10)
(first and third harmonics)

Energy range

20 - 350 eV

Monochromator

SGM (gratings: 380, 925, 2100 l/mm)

Calculated flux (1.9 GeV, 400 mA)

~1013 photons/sec/0.01%BW (resolution dependent)

Resolving power (E/DE)

~10,000 (selectable by slit width)

Endstations

High-energy-resolution spectrometer (HERS)
Ion-beam endstation
High-resolution gas-phase electron spectrometer

 

Endstation identifier

High-energy-resolution spectrometer (HERS)

Scientific applications

Studies of highly correlated electron systems using angle-resolved photoemission of solids

Characteristics

Optimized for high-resolution studies of highly correlated electron systems at low temperature

Detectors

Scienta SES-200 hemispherical electron energy analyzer with angular mode
LEED
Partial-yield detector

Spot size at sample

100 µm (h) x less than 100 µm (v) depending on exit slit setting

Samples

Solids in UHV

Local contact

Name: Scot Kellar
Phone: (510) 486-4989
Fax: (510) 486-2999
Email: sakellar@lbl.gov

Spokesperson

Name: Prof. Z.X. Shen
Affiliation: Stanford University
Phone: (650) 725-8254
Fax: (650) 725-5457
Email: shen@ee.stanford.edu

 

Endstation identifier

Ion-beam endstation (available fall 1998)

Scientific applications

Photoionization of ions

Characteristics

The charged ion beam from the ion accelerator is merged with the photon beam (counter propagating) for approximately 0.5 m. An analyzing magnet disperses the ion beam based on charge state following the interaction region.

Spot size at sample

1.5 mm (h) x 1.5 mm (v)

Samples

Beam of positively charged ions

Sample environment

Differential pumping permits gas pressures of up to 10-5 Torr

Local contact

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499
Email: fred_schlachter@lbl.gov

Spokespersons

Name: Nora Berrah
Affiliation: Western Michigan University
Phone: (616) 387-4955
Fax: (616) 387-4939
Email: berrah@wmich.edu

Name: Prof. Ronald A. Phaneuf
Affiliation: University of Nevada-Reno
Phone: (702) 784-6816
Fax: (702) 784-1398
Email: phaneuf@physics.unr.edu

 

Endstation identifier

 High-resolution gas-phase electron spectrometer
(available summer 1998)

Scientific applications

High-resolution atomic and molecular electron spectroscopy

Characteristics

The electron spectrometer uses a gas cell on the beam axis to form the interaction region between the sample and the photon beam. The analyzer rotates from 0° to 90° relative to the polarization vector of the photon beam, permitting angle-resolved measurements.

Detector

Scienta electron spectrometer

Spot size at sample

0.4 mm (h) x 0.1 - 0.5 mm (v) depending on exit slit setting

Samples

Gas cell

Sample environment

Differential pumping permits gas pressures of up to 10-5 Torr

Special notes

Vented gas cabinets are available for hazardous samples

Local contact

Name: John D. Bozek
Phone: (510) 486-4967
Fax: (510) 486-7696
Email: jdbozek@lbl.gov

Spokesperson

Name: Nora Berrah
Affiliation: Western Michigan University
Phone: (616) 387-4955
Fax: (616) 387-4939
Email: berrah@wmich.edu

Table of all beamlines