Operational

Now

Source characteristics

Bend magnet

Energy range

3 - 20 keV (without multilayer mirrors)
6 - 15 keV (with multilayer mirrors)

Monochromator

Calculated flux (1.9 GeV, 400 mA)

Multilayer mirrors in Kirkpatrick-Baez configuration
3 x 10¹⁰ photons/sec

Resolving power (E/DE)

25 at 12.5 keV

Endstation

Large hutch with optical table

Characteristics

X-ray fluorescence analysis of samples with high elemental sensitivity and high spatial resolution

Spatial resolution

1.0 x 1.2 µm

Detectors

Si (Li)

Spot size at sample

1.0 x 1.2 µm

Samples

Format

Samples are usually mounted between two layers of super-clean polypropylene. Standard sample holders are available for samples less than 2 cm in diameter.

Preparation

Almost any sample can be measured since samples are measured in air.

Sample environment

Air

Special notes

By special arrangement, the focusing mirrors can be removed and then the white-light beam can be used for experiments that require white radiation (e.g., testing capillary optics or evaluating x-ray collimators)

Scientific applications

Trace element analysis with high spatial resolution, for example silicon solar cells, GaN, environmental soil samples, and biological samples; testing of x-ray capillary optics and new x-ray detectors

Local contact/spokesperson

Name: Al Thompson
Affiliation: Center for X-Ray Optics, Berkeley Lab
Phone: (510) 486-5590
Fax: (510) 486-4550
Email: thompson@lbl.gov