|
Operational
|
Now
|
|
Source characteristics
|
8-cm-period undulator (U8)
|
|
Energy range
|
60 - 320 eV
|
|
Monochromator
|
VLG-PGM
|
|
Calculated flux (1.9 GeV, 400 mA)
|
~5 x 1013 photons/sec/1%BW at 134 eV
|
|
Resolving power (E/DE)
|
200 - 1000
|
|
Endstation
|
EUV interferometer
|
|
Detectors
|
GaAsP flux monitor, silicon 1000 x 1000 CCD array
|
|
Samples
|
|
Format
|
All-reflective, multilayer-coated EUV optics
|
|
Sample environment
|
10-7 Torr or 10-4 Torr of O2
|
|
Scientific applications
|
Interferometric wavefront measurement of optics designed for EUV lithography
|
|
Local contact
|
Name: Kenneth A. Goldberg
Phone: (510) 486-2261
Fax: (510) 486-4550
Email: kagoldberg@lbl.gov
|
|
Spokesperson
|
Name: Jeffrey Bokor
Affiliation: U.C. Berkeley;
Center for X-Ray Optics, Berkeley Lab
Phone: (510) 642-4134
Fax: (510) 642-2739
Email: jbokor@light.eecs.berkeley.edu
|