|
|
 |
|
 |
 |
Beamline 6.3.1
Calibration and Standards, EUV/Soft X-Ray Optics Testing,
Solid-State Chemistry
|
Operational
|
Now
|
|
Source characteristics
|
Bend magnet
|
|
Energy range
|
500 - 2000 eV
|
|
Monochromator
|
VLS-PGM
|
| Calculated flux (1.9 GeV, 400 mA) |
1011 photons/s/0.01%BW at 1000 eV
|
| Resolving power (E/DE) |
5000
|
|
Endstations
|
Reflectometer
|
|
Characteristics
|
VLS-PGM monochromator with fixed exit slit and refocusing mirror; 2-circle goniometer with x, y, z, q sample mirror
|
|
Spatial resolution
|
Can position to 1 µm
|
|
Detectors
|
Si diode, CEM, MCP, total yield
|
|
Spot size at sample
|
5 x 200 µm
|
|
Samples
|
|
Format
|
Solid-state, gas phase; foils, powders, etc.
|
|
Sample environment
|
High vacuum or UHV
|
|
Scientific applications
|
Solid-state chemistry to the Al and Si K edges, atomic physics reflectometry, scattering
|
|
Local contact/spokesperson
|
Name: Jim H. Underwood
Affiliation: Center for X-Ray Optics, Berkeley Lab
Phone: (510) 486-4958
Fax: (510) 486-4550
Email: jhunderwood@lbl.gov
|
Table of all beamlines
|
 |
|