Beamline 7.3.3
Micro X-Ray Diffraction, Micro X-Ray Absorption Spectroscopy,
Hard X-Ray Optics Testing
(Femtosecond work will move to Beamline 5.3.1 in the summer of 2000.)
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Operational |
Now |
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Source characteristics |
Bend magnet |
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Energy range |
6 - 12 keV |
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Monochromator |
White light and monochromatic [two- and four-crystal Ge(111)] |
| Calculated flux (1.9 GeV, 400 mA) | Monochromatic (8.5 keV): 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) 1 x 1012 photons/s/3x10-4BW (100 x 300 µm spot) |
| Resolving power (E/DE) |
3500 at 8.5 keV (monochromatic) |
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Endstation |
Micro x-ray diffraction, micro x-ray absorption spectroscopy, hard x-ray optics testing |
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Characteristics |
Designed for microprobe, white-light, and monochromatic experiments |
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Detectors |
X-ray CCD, fluorescence Si(Li) detector |
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Spot size at sample |
100 x 300 µm down to 1 x 1 µm |
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Samples |
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Format |
Typically less than 1 cm2 x 1 mm thick |
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Sample environment |
Typically air |
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Scientific applications |
Measurement of strain, environmental science, optics testing |
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Local contact/spokesperson |
Name: A.A. MacDowell |