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Polymers make perfect building blocks for manufacturing nanostructures because
of their variable chemical functionality and the size of the polymer molecules.
Moreover, the morphology and other important properties of polymers, such as
wetting, adhesion, or bio-compatibility, can be externally modified, e.g.,
by solvents. Such adaptive behavior is very promising for the engineering of
smart surfaces for biomedical applications and nanodevices. For example, a
mixed brush of hydrophilic and hydrophobic homopolymers that is exposed to
a hydrophilic solvent should chemically segregate, and the hydrophilic component
should accumulate at the surface, a process called perpendicular segregation.
Although the reversible switching from hydrophilic to hydrophobic character
has been observed, the local chemical structure has remained unknown.
Sketch of a mixed polymer brush comprising hydrophilic and hydrophobic homopolymers.
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To Bead or Not to Bead
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Photoemission electron microscopy based on near-edge
x-ray absorption fine structure (NEXAFS) provides a way to identify
differences in local chemical structure. By combining NEXAFS, which
has been very successfully used for years in spectroscopic studies
of polymer materials, with the high surface sensitivity and the
high nanometer spatial resolution (< 50 nm) of the PEEM-2 on
ALS Beamline 7.3.1.1, the researchers were able to image the chemical
structure at the surface of a mixed polymer brush, including the
lateral and perpendicular segregation predicted by self-consistent-field
(SCF) calculations. They were also able to correlate the chemical
morphology of the sample with its topography, as detected by atomic
force microscopy.
The samples, a mixed brush whose two components were a random
copolymer of styrene and pentafluorostyrene (PSF) and of polymethyl
methacrylate
(PMMA), were fabricated at the Institute for Polymer Research in
Dresden, Germany. The German collaborators used a sophisticated
technique of grafting the two incompatible polymers randomly
on the surface
of a silicon wafer, which prevents macroscopic phase separation
of the hydrophobic PSF and hydrophilic PMMA.
An AFM image of a PSF/PMMA brush after treatment with toluene shows
that exposure to toluene creates a "ripple phase" (a). The PEEM images
show inverted contrast (arrows) at x-ray energies
specific
for PSF (b) and PMMA (c).
Utilizing the chemical sensitivity of PEEM, the researchers observed
that after exposure to the nonselective solvent toluene, the components
of the mixed polymer brush created a laterally segregated "ripple" phase
comprising worm-like domains, 150 to 160 nm in width. This lateral
segregation showed up in PEEM images, which were acquired at two
specific x-ray energies corresponding to characteristic absorption
peaks for the two polymers at the carbon absorption edge, as a reversal
in contrast. This observation was corroborated by atomic force microscope
images, which showed the same ripple phase in the topography of the
sample. The observed lateral segregation was predicted by the SCF
calculations, which considered, among other parameters, the length
of the polymer chains, the repulsion between the chains, and the
selectivity of the solvent.

An AFM image of a PSF/PMMA brush after treatment with acetone shows
that exposure to acetone creates a "dimple phase" (d).
The surface is dominantly PMMA, and PEEM images (e,f) show no
indication
of contrast reversal.
When the polymer was exposed to the selective solvent acetone,
a hydrophilic solvent that preferentially dissolves the PMMA
component,
a new polymer phase was observed that could be described as a "dimple
phase," with both lateral and perpendicular segregation. The
segregation of the two polymer components perpendicular to the surface
resulted in an enhancement of the PMMA at the top of the brush. This
segregation appeared in the microscopic PEEM images as a strong reduction
in contrast, owing to the prevalence of one polymer component at
the surface. Calculations were again able to explain the formation
of this new polymer phase.
Research conducted by S. Minko, D. Usov, C. Froeck, and M. Stamm
(Institut für Polymerforschung Dresden); M. Müller (Johannes
Gutenberg Universität); and A. Scholl (Berkeley Lab).
Research funding: Federal Ministry for Education and Research (BMBF)
and German Research Foundation (DFG). Operation of the ALS is supported
by the U.S. Department of Energy, Office of Basic Energy Sciences.
Publication about this research: S. Minko, M. Müller, D. Usov,
A. Scholl, C. Froeck, and M. Stamm, "Lateral versus Perpendicular
Segregation in Mixed Polymer Brushes," Phys. Rev. Lett. 88,
035502 (2002). |