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Beamline 6.3.2

Calibration and Standards; EUV Optics Testing; Atomic, Molecular, and Materials Science

Operational

Now

Source characteristics

Bend magnet

Energy range

50-1300 eV

Monochromator

VLS-PGM

Calculated flux (1.9 GeV, 400 mA)

1011 photons/s/0.01%BW at 100 eV

Resolving power (E/ΔE)

7000

Endstations

Reflectometer

Characteristics

2-circle goniometer with x, y, z, q movement of sample

Spatial resolution

Can position to 1 µm, 0.002°

Detectors

Photodiode, channeltron, and CCD camera on a rotating arm

Spot size at sample

10 (v) x 300 (h) µm

Samples

 

Format

Solid state, gas phase; foils, powders, films up to 20 cm in diameter

Sample environment

High vacuum or UHV

Scientific applications

Solid-state chemistry, gas phase, atomic physics, reflectometry, scattering

Local contact

Name: Andy Aquila
Phone: (510) 495-2063
Fax: (510) 486-4955
Email: alaquila@lbl.gov

Spokesperson

Name: Eric Gullikson
Affiliation: Center for X-Ray Optics, Berkeley Lab
Phone: (510) 486-6646
Fax: (510) 486-4550
Email: emgullikson@lbl.gov

Beamline phone number

(510) 495-2063

A data sheet about this beamline is available in Portable Document Format (PDF)

More information about this beamline is available at the CXRO Beamline 6.3.2 Web site.

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Diagram of all beamlines