Beamline 8.0.1

Surface and Materials Science, Imaging Photoelectron Spectroscopy, Soft X-Ray Fluorescence

Operational	Now
Source characteristics	5-cm-period undulator (U5) (first, third, and fifth harmonics)
Energy range	65-1400 eV (1.5 GeV); ~80-1400 eV (1.9 GeV)
Monochromator	SGM (gratings: 150, 380, 925 lines/mm)
Flux (1.9 GeV, 400 mA)	10¹¹ to 6 x 10¹⁵ photons/s (resolution and energy dependent)
Resolving power (E/ΔE)	<8000
Endstation	Soft x-ray fluorescence (SXF) spectrometer
Beamline phone numbers	(510) 495-2080, (510) 495-2089

Endstation	Soft x-ray fluorescence (SXF) spectrometer
Characteristics	Measures the soft x-ray emission from solid samples with a dispersive grating spectrometer
Spot size at sample	100 (h) x 50 to 3000 (v) µm
Samples
Format	UHV-compatible solids up to 2 cm in diameter; 5-mm diameter optimal
Sample environment	UHV
Special notes	Sample transfer capabilities
Experimental techniques	SXF, NEXAFS, fluorescence-yield XAS of solids
Local contact	W. Yang Phone: (510) 486-4989
Spokesperson	Thomas Callcott Affiliation: University of Tennessee Phone: (865) 974-8944 Fax: (865) 974-3949

Several data sheets about this beamline are available as PDF files.