Operational

See endstation tables

Source characteristics

Bend magnet

Energy range

2.2-5.5 keV with Si(111) crystals

Monochromator

Double crystal

Measured flux (1.9 GeV, 300 mA)

10¹¹ photons/s

Resolving power (E/ΔE)

3000-8000

Endstations

Angle-resolved time-of-flight electron spectrometer
Ion time-of-flight spectrometer
Magnetic mass analyzer
Polarized-x-ray emission spectrometer
X-ray absorption cell
XAFS station

Beamline phone number

(510) 495-2094

Endstation

Angle-resolved time-of-flight electron spectrometer

Operational

Now

Characteristics

Timing resolution ±200 ps; chamber rotates about x-ray beam (±100°)

Detectors

5 time-of-flight electron analyzers (0.5 m long)

Spot size at sample

<0.5 mm

Samples

Gases

Sample environment

Gas-phase flow system

Scientific applications

Photoelectron and Auger spectroscopy, electron-electron coincidence

Local contacts

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499

Name: Wayne Stolte
Phone: (510) 486-5804
Fax: (510) 495-2111

Spokesperson

Name: Dennis Lindle
Affiliation: University of Nevada, Las Vegas
Phone: (702) 895-4426
Fax: (702) 895-4072

Endstation

Ion time-of-flight spectrometer

Operational

Now

Characteristics

Timing resolution ~200 ps; capable of coincidence measurement (ion-ion, ion-ion-ion, electron-ion, electron-ion-ion, etc.)

Detectors

Microchannel plates for ions, channeltron for electrons

Spot size at sample

<0.5 mm

Samples

Gases

Sample environment

Gas-phase flow system

Scientific applications

Ion spectroscopy, total and partial ion yields, PIPICO, PEPICO, PEPIPICO, etc.

Local contacts

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499

Name: Wayne Stolte
Phone: (510) 486-5804
Fax: (510) 495-2111

Spokesperson

Name: Dennis Lindle
Affiliation: University of Nevada, Las Vegas
Phone: (702) 895-4426
Fax: (702) 895-4072

Endstation

Magnetic mass analyzer

Operational

Now

Characteristics

Measures mass-to-charge ratios up to 40 (60 if short scan); resolution of 1/50

Detectors

Dr. Sjuts channel electron multiplier

Spot size at sample

1-2 mm

Samples

Gases

Sample environment

Gas-phase flow system

Experimental techniques

Ion/anion spectroscopy

Local contacts

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499

Name: Wayne Stolte
Phone: (510) 486-5804
Fax: (510) 495-2111

Spokesperson

Name: Wayne Stolte
Affiliation: Advanced Light Source, Berkeley lab
Phone: (510) 486-5804
Fax: (510) 495-2111

Endstation

Polarized-x-ray emission spectrometer

Operational

Now

Characteristics

High x-ray energy resolution (E/DE ~3000). Curved-crystal Rowland-circle spectrometer

Detectors

2-D position-sensitive detector (microchannel plates plus resistive anode)

Spot size at sample

<0.5 mm

Samples

Gases

Sample environment

Static gas cell with windows

Experimental techniques

X-ray emission

Local contacts

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499

Name: Wayne Stolte
Phone: (510) 486-5804
Fax: (510) 495-2111

Spokesperson

Name: Dennis Lindle
Affiliation: University of Nevada, Las Vegas
Phone: (702) 895-4426
Fax: (702) 895-4072

Endstation

X-ray absorption cell

Operational

Now

Detectors

Photodiode/current from plate

Spot size at sample

1-2 mm

Samples

gases

Sample environment

UHV, gas cell

Experimental techniques

NEXAFS

Local contacts

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499

Name: Wayne Stolte
Phone: (510) 486-5804
Fax: (510) 495-2111

Spokesperson

Name: Dennis Lindle
Affiliation: University of Nevada, Las Vegas
Phone: (702) 895-4426
Fax: (702) 895-4072

Endstation

XAFS station

Operational

Now

Detectors

Si photodiode

Spot size at sample

1-2 mm

Samples

Solids, liquids

Sample environment

High vacuum, heated or cooled, helium

Experimental techniques

NEXAFS, XAFS

Local contacts

Name: Fred Schlachter
Phone: (510) 486-4892
Fax: (510) 486-6499

Spokesperson

Name: Heinz Frei
Affiliation: Physical Biosciences Division, Berkeley Lab
Phone: (510) 486-4325
Fax: (510) 486-6059